Cumulative disorder and x-ray line broadening in multilayers.
نویسندگان
چکیده
We have measured the high-angle x-ray diffraction from crystalline Pb-amorphous Ge multilayers. The experimental data in conjunction with a model calculation for the fluctuation in amorphous-layer thickness show that this fluctuation is larger than about 5%. A smaller thickness variation implies the existence of high-angle peaks which have not been observed in any amorphous-crystalline multilayers.
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عنوان ژورنال:
- Physical review. B, Condensed matter
دوره 34 8 شماره
صفحات -
تاریخ انتشار 1986